Principal Techniques
- Scanning Electron Microscopy (SEM)
- Focused Ion Beam (FIB)
- X-Ray Photoelectron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Secondary Ion Mass Sepectrometry (SIMS)
- Transmission Electron Microscopy (TEM)
- Dual Beam FIB (DB-FIB)
- Energy Dispersive Spectroscopy (EDS)
NIMAC expands 2013!
- Advanced materials/surface characterization system including XPS/ AES/ SIMS. This system will also have depth profiling and UPS.
- Ireland's first Cryogenic Transmission Electron Microscope (Cryo-TEM)
- UCD's first 300KV Field Emission Gun (FEG)TEM
Metallurgy Analysis / Testing
- Tensile strength
- Hardness
- Optical Emission Spectrometer
- Adhesion
- Flexural Strength
- Compressive Strength
- Modulus of Rupture