Nano Imaging and Material Analysis Centre
Ionad um Íomháú Nana agus Anailís Ábhar
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Dual Beam FIB (DB-FIB)
Home
Techniques
Dual Beam FIB (DB-FIB)
Dual Beam FIB (DB-FIB)
Key Benefits
Site specific cross sections and TEM sample prep
Nano size milling and structure deposition
Capabilities
Semiconductor failure analysis
Identification of sub surface defects
Thickness measurements on thin films
Nano Imaging and Material Analysis Centre (NIMAC)
School of Chemical and Bioprocess Engineering, University College Dublin, Belfield, Dublin 4, Ireland.
T:
+353 1 716 1724
| E:
ian.reid@ucd.ie