Focused Ion Beam (FIB)
Key Benefits of FIB
- High resolution Focused Ion Beam (FIB) cross sections
- Quick (S)TEM sample preparation
- Circuit edits for semiconductor applications
- Failure Analysis technique
- Milling and deposition of complex structures
Capabilities
- DualBeam FIB - 5nm resolution
- Milling of cross sections up to 50 microns in depth
- Large samples accomadated
