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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

Key Benefits

  • The most versatile Field Emission Scanning Electron Microscope (FE-SEM) available
  • High Resolution images of surfaces
  • Supports many other analytical techniques (FIB, STEM, EDS, WDS, EBSD, CL)
  • Environmental SEM capabilitiesSEM image

Capabilities

  • 2 Scanning Electron Microscope in house                  
  • 1.1 nm resolution FEG SEM
  • Large sample capability (6cm in diameter)
  • Wide varietly of sample analysis capabilitesSEM image 2

Nano Imaging and Material Analysis Centre (NIMAC)

School of Chemical and Bioprocess Engineering, University College Dublin, Belfield, Dublin 4, Ireland.
T: +353 1 716 1724 | E: ian.reid@ucd.ie