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X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS)

Key Benefits of XPS analysis

  • X-Ray Photoelectron Spectroscopy (XPS) sensitivity at 0.1 At% XPS spectra
  • Quantitative chemical information of the first 10nm atomic layers
  • Oxidation state information of elements on the surface
  • Multi sample capability
  • Advanced failure analysis capability

Capabilities in NIMAC

  • Chemical information on the first 5-10nm

XPS spectra

Nano Imaging and Material Analysis Centre (NIMAC)

School of Chemical and Bioprocess Engineering, University College Dublin, Belfield, Dublin 4, Ireland.
T: +353 1 716 1724 | E: ian.reid@ucd.ie